The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2014
Filed:
Mar. 28, 2014
Fujifilm Corporation, Tokyo, JP;
Keita Watanabe, Ashigarakami-gun, JP;
Kentaro Noma, Ashigarakami-gun, JP;
Yasufumi Oda, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Binning readout reads out electric charge accumulated in pixels to signal lines in blocks of a plurality of adjoining pixel-rows. A correction image generator of a line defect corrector scales up an image size of a reference frame image RP outputted by the binning readout and corrects pixel values of the reference frame image RP, to produce a correction image RPC to be used for correction of a line defect occurring in an X-ray image XP. The scale-up is performed by applying row interpolation processing to the reference frame image RP. The correction of the pixel values is performed by multiplying the reference frame image RP after being subjected to the row interpolation processing by a correction coefficient. An adder adds the correction image RPC to the X-ray image XP, and produces an X-ray image XPC in which the line defect is corrected.