The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Sep. 06, 2012
Applicants:

Erwan Baleine, Orlando, FL (US);

James F. Landy, Cape Canaveral, FL (US);

Ching-pang Lee, Cincinnati, OH (US);

Stephanie Stinelli, Edgewater, FL (US);

Inventors:

Erwan Baleine, Orlando, FL (US);

James F. Landy, Cape Canaveral, FL (US);

Ching-Pang Lee, Cincinnati, OH (US);

Stephanie Stinelli, Edgewater, FL (US);

Assignee:

Siemens Energy, Inc., Orlando, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of nondestructive evaluation and related system. The method includes arranging a test piece () having an internal passage () and an external surface () and a thermal calibrator () within a field of view () of an infrared sensor (); generating a flow () of fluid characterized by a fluid temperature; exposing the test piece internal passage () and the thermal calibrator () to fluid from the flow (); capturing infrared emission information of the test piece external surface () and of the thermal calibrator () simultaneously using the infrared sensor (), wherein the test piece infrared emission information includes emission intensity information, and wherein the thermal calibrator infrared emission information includes a reference emission intensity associated with the fluid temperature; and normalizing the test piece emission intensity information against the reference emission intensity.


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