The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Oct. 05, 2006
Applicants:

Mitsunori Kirihata, Osaka, JP;

Tomoyuki Asano, Osaka, JP;

Kohki Uehara, Osaka, JP;

Inventors:

Mitsunori Kirihata, Osaka, JP;

Tomoyuki Asano, Osaka, JP;

Kohki Uehara, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07K 16/00 (2006.01); C12P 21/08 (2006.01); C07K 16/44 (2006.01); G01N 33/53 (2006.01); G01N 33/94 (2006.01); C07F 5/02 (2006.01); G01N 33/84 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5308 (2013.01); C07K 16/44 (2013.01); G01N 33/94 (2013.01); C07F 5/027 (2013.01); G01N 33/84 (2013.01);
Abstract

The present invention is a compound having a structure represented by the following formula (1): and an antibody to BSH obtained by using the compound as a hapten and using a complex of the hapten and a high-molecular compound as an antigen. By using the present invention, it becomes possible to provide a hapten compound for preparing an antibody recognizing BSH highly sensitively and highly selectively, an antibody to BSH, as well as a kit for measuring BSH and an immunological measuring method having high sensitivity and excellent in quantitative property using the antibody.


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