The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Jul. 20, 2011
Applicants:

Young-jin Chang, Yongin, KR;

Jae-hwan OH, Yongin, KR;

Won-kyu Lee, Yongin, KR;

Seong-hyun Jin, Yongin, KR;

Jae-beom Choi, Yongin, KR;

Inventors:

Young-Jin Chang, Yongin, KR;

Jae-Hwan Oh, Yongin, KR;

Won-Kyu Lee, Yongin, KR;

Seong-Hyun Jin, Yongin, KR;

Jae-Beom Choi, Yongin, KR;

Assignee:

Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 27/12 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1214 (2013.01); H01L 21/02422 (2013.01); H01L 21/02675 (2013.01); H01L 21/02532 (2013.01);
Abstract

An embodiment is directed to a method of manufacturing a polycrystalline silicon layer, the method including providing a crystallization substrate, the crystallization substrate having an amorphous silicon layer on a first substrate, providing a reflection substrate, the reflection substrate having a first region with a reflection panel therein and a second region without the reflection panel, disposing the crystallization substrate and the reflection substrate on one another, and selectively crystallizing the amorphous silicon layer by directing a laser beam onto the crystallization substrate and the reflection substrate, and reflecting the laser beam from the reflection panel.


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