The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Oct. 22, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mahadevaiyer Krishnan, Hopewell Junction, NY (US);

Jun Liu, Irvington, NY (US);

Satyavolu S. Papa Rao, Poughkeepsie, NY (US);

George G. Totir, Newtown, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C09K 13/02 (2006.01); H01L 31/18 (2006.01); H01L 31/0236 (2006.01); H01L 31/0384 (2006.01); B82Y 30/00 (2011.01);
U.S. Cl.
CPC ...
H01L 31/03845 (2013.01); H01L 31/186 (2013.01); H01L 31/02363 (2013.01); C09K 13/02 (2013.01); Y02E 10/547 (2013.01); B82Y 30/00 (2013.01); H01L 31/1804 (2013.01);
Abstract

A method of texturing a surface of a crystalline silicon substrate is provided. The method includes immersing a crystalline silicon substrate into an aqueous alkaline etchant solution to form a pyramid shaped textured surface, with (111) faces exposed, on the crystalline silicon substrate. The aqueous alkaline etchant solution employed in the method of the present disclosure includes an alkaline component and a nanoparticle slurry component. Specifically, the aqueous alkaline etchant solution of the present disclosure includes 0.5 weight percent to 5 weight percent of an alkaline component and from 0.1 weight percent to 5 weight percent of a nanoparticle slurry on a dry basis.


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