The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Mar. 23, 2007
Applicants:

Franz Merz, Aalen, DE;

Peter Reimer, Ellwangen, DE;

Fritz Straehle, Heubach, DE;

Inventors:

Franz Merz, Aalen, DE;

Peter Reimer, Ellwangen, DE;

Fritz Straehle, Heubach, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/00 (2013.01);
Abstract

Among other things, an illumination device () is described for one, two or more observation beam paths, each with an observation device having an observation beam bundle, in particular for an operating microscope, having at least one light source () for producing at least one illumination beam bundle for illuminating an object to be observed (), in particular, an eye to be observed, wherein the at least one illumination beam bundle runs coaxially to an observation beam bundle. It is provided according to the invention, in order to be able to suppress disruptive reflections, that illumination device () has an illumination optics () that is constructed according to the Köhler principle of illumination, and in which at least one reflection diaphragm () is provided in order to avoid light reflected from the surface of an objective element (). In addition, a correspondingly improved observation device is described.


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