The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2014

Filed:

Sep. 29, 2011
Applicants:

Takeshi Kanomata, Hachioji, JP;

Hiroaki Yamura, Hachioji, JP;

Inventors:

Takeshi Kanomata, Hachioji, JP;

Hiroaki Yamura, Hachioji, JP;

Assignee:

JASCO Corporation, Hachioji-shi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 7/00 (2006.01); G01L 9/00 (2006.01);
U.S. Cl.
CPC ...
G01L 9/0002 (2013.01);
Abstract

A pressure gauge mounted to a pump or a back pressure regulator in an HPLC, SFC, or SFE system provides improved solvent exchange and improved measurement precision. A through hole having an inside diameter of 1.0 mm is made in a hexagonal member similar in shape to a pipe joint. A part of the hexagonal member is cut away to form a flat surface such that the distance to the outside periphery of the through hole is 0.5 mm to serve as a strain-measurement strain gauge attaching surface. One strain gauge is attached to the center of the strain-measurement strain gauge attaching surface, and two strain gauges are attached for temperature correction, one on the same surface as the strain-measurement strain gauge attaching surface and the other on an outside surface of the hexagonal member.


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