The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Sep. 16, 2008
Applicants:

Tetsuro Motoyama, Cupertino, CA (US);

Avery Fong, Castro Valley, CA (US);

Inventors:

Tetsuro Motoyama, Cupertino, CA (US);

Avery Fong, Castro Valley, CA (US);

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/06 (2013.01); G06Q 10/063114 (2013.01);
Abstract

A project management system manages project schedule data using project task state data. The project task state data indicates the current state of project tasks and is used to determine which project tasks are to be included in a member schedule editor, member schedule reports and inspection reports. The project management system also provides support for various inspection functionality. This includes, for example, identifying and naming inspection material for use in inspection meeting forms and inspection meeting documents. The inspection functionality also includes generating an inspection index and an inspection statistics report.


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