The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Oct. 04, 2010
Shunji Saitoh, Tokyo, JP;
Tatsumi Kameyama, Tokyo, JP;
Shunji Saitoh, Tokyo, JP;
Tatsumi Kameyama, Tokyo, JP;
Oval Corporation, Tokyo, JP;
Abstract
Provided is a measuring instrument for measuring an object to be measured, including: a CPU () including a plurality of internal timer counters and having a function of calculating a measured value of the object to be measured based on detection values of various sensors; a power supply circuit () for supplying power to the CPU (); a detector () for detecting a state of the object to be measured; a display unit () for displaying detection input data input from the various sensors and the state of the object to be measured, which is obtained through a calculation; a real-time clock IC (RTC) () for measuring an elapsed time; an EEPROM () for storing data input to the CPU (); and an FeRAM () for storing input values from the various sensors, and storing a calculation result obtained through a calculation performed by the CPU () based on the input values from the various sensors.