The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Aug. 21, 2008
Lyubomir Zagorchev, Lebanon, NH (US);
Andrew Buckler, Wenham, MA (US);
Eric Jean, Woburn, MA (US);
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
Investigation of in vivo models of disease requires imaging studies involving single subjects in single imaging sessions, serial imaging of individuals or groups of subjects, and integration of data across diverse and heterogeneous experimental methodologies. Each type of experiment is preferably supported by various feature sets that can be rigorously applied to produce quantitative, reproducible results. Current imaging scanners are not equipped with standardized capability that supports an automated and scientifically rigorous workflow suited to hypothesis testing. An imaging system includes a research workstation at which a user can design, execute, study, and report imaging plans. Flexibility that comes along with a modular design of the system allows the user to customize workflow parameters for more robust hypothesis testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile