The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Nov. 01, 2012
Applicants:

Haihua Yu, Beijing, CN;

Hong Yi, Beijing, CN;

Wei Wang, Beijing, CN;

Inventors:

Haihua Yu, Beijing, CN;

Hong Yi, Beijing, CN;

Wei Wang, Beijing, CN;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/36 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/00 (2013.01); G06T 2207/10152 (2013.01); G06T 7/0042 (2013.01); G06T 2207/20164 (2013.01); G06T 2207/10016 (2013.01);
Abstract

A method and an apparatus for determining a projection area of an image are provided. The method for determining a projection area of an image, comprises: an input step of inputting an image sequence having a plurality of images; a detecting step of detecting locations of projection areas of the respective images in the image sequence; a relationship classification judging step of judging a relationship classification between the image and a previous image before the image being projected based on a relationship between the location of the projection area of the image and the location of the projection area of the previous image; and a determining step of determining the locations of the projection areas of the respective images based on the relationship classification judged in the relationship classification judging step.


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