The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Jan. 17, 2013
Applicants:

Paul Pellegrini, Bedford, MA (US);

Steven Disalvo, Chelmsford, MA (US);

Luigi Spagnuolo, Andover, MA (US);

Mark Gill, Everett, MA (US);

Michael J Noyola, Centerville, OH (US);

Inventors:

Paul Pellegrini, Bedford, MA (US);

Steven DiSalvo, Chelmsford, MA (US);

Luigi Spagnuolo, Andover, MA (US);

Mark Gill, Everett, MA (US);

Michael J Noyola, Centerville, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/00 (2013.01); G06K 9/0063 (2013.01); G06K 9/6201 (2013.01); G06K 9/6247 (2013.01);
Abstract

A method, apparatus and program product are provided for simplifying electro-optical imaging data. Spectral/temporal data is received. The spectral/temporal data is formulated into a vector/matrix. Feature extraction analysis is performed. At least two largest principal components are determined from the feature extraction analysis. A cluster diagram is created from the at least two largest principal components. A distance metric is evaluated from the cluster diagram. And, a largest metric is selected based on the distance metric.


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