The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Mar. 05, 2008
Shiro Fujieda, Kyoto, JP;
Shiro Fujieda, Kyoto, JP;
Omron Corporation, Kyoto, JP;
Abstract
A recognition processing method and an image processing device ends recognition of an object within a predetermined time while maintaining the recognition accuracy. The device extracts combinations of three points defining a triangle whose side length satisfy predetermined criterion values from feature points of the model of a recognition object, registers the extracted combinations as model triangles, and similarly extracts combinations of three points defining a triangle whose side lengths satisfy predetermined criterion values from feature points of the recognition object. The combinations are used as comparison object triangles and associated with the respective model triangles. The device calculates a transformation parameter representing the correspondence relation between each comparison object triangle and the corresponding model triangle using the coordinates of the corresponding points (A and A', B and B′, and C and C′), determines the goodness of fit of the transformation parameters on the relation between the feature points of the model and those of the recognition object. The object is recognized by specifying the transformation parameters representing the correspondence relation between the feature points of the model and those of the recognition object according to the goodness of fit determined for each association.