The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Aug. 04, 2010
Applicants:

Toshiyuki Irie, Hitachi, JP;

Hironori Ueki, Hachioji, JP;

Keisuke Yamakawa, Kokubunji, JP;

Inventors:

Toshiyuki Irie, Hitachi, JP;

Hironori Ueki, Hachioji, JP;

Keisuke Yamakawa, Kokubunji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/504 (2013.01); A61B 6/481 (2013.01); A61B 6/541 (2013.01); A61B 6/503 (2013.01);
Abstract

A view image of high time resolution acquired in an imaging process of X-ray CT is displayed. In this display, by subtracting a background image obtained by forward projection calculation of a CT image from the view image, background is removed from the view image, and only a focused site is imaged. A transmission image of the focused site showing high display contrast and not easily influenced by a motion artifact can be thereby obtained. Thereby, in an X-ray CT device for diagnostic imaging, degradation of diagnostic ability due to motion artifacts can be prevented.


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