The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Nov. 30, 2011
Applicants:
Derek J. Michaels, Vernon, CT (US);
Rodney H. Warner, Austin, TX (US);
Inventors:
Derek J. Michaels, Vernon, CT (US);
Rodney H. Warner, Austin, TX (US);
Assignee:
United Technologies Corporation, Hartford, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An exemplary component measuring method includes determining a position of an aperture of a component using a computed tomography scan of a gage and a component. The gage is inserted into the aperture of the component during the computed tomography scan.
Michaels, Derek. (2014). Component aperture location using computed tomography (U.S. Patent No. 8861673). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8861673
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile