The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Aug. 28, 2006
Jeong-hwan Seo, Suwon-si, KR;
Se-hong Kim, Suwon-si, KR;
Byung-in Mun, Suwon-si, KR;
Sang-su Nam, Seoul, KR;
Hye-eun Choi, Seoul, KR;
Jeong-hwan Seo, Suwon-si, KR;
Se-hong Kim, Suwon-si, KR;
Byung-in Mun, Suwon-si, KR;
Sang-su Nam, Seoul, KR;
Hye-eun Choi, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method and apparatus for measuring the quality of wireless channels based on a result obtained by measuring contentions between stations in a wireless network employing a carrier sense multiple access/collision avoidance (CSMA/CA) medium access control (MAC) method specified in the IEEE 802.11 standard are provided. The method includes determining contentions between stations to transmit frames via a wireless channel that uses a contention-based medium access method, and measuring the quality of the wireless channel based on the determined contentions.