The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Mar. 12, 2013
Applicant:

Takehiro Nakajima, Tokyo, JP;

Inventor:

Takehiro Nakajima, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/407 (2006.01); H04N 1/60 (2006.01); G06K 15/02 (2006.01); H04N 1/40 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1872 (2013.01); H04N 1/40006 (2013.01); H04N 1/00068 (2013.01); H04N 1/00045 (2013.01); H04N 1/00034 (2013.01); H04N 1/00015 (2013.01); H04N 1/407 (2013.01); H04N 1/6027 (2013.01); H04N 1/6033 (2013.01);
Abstract

An image forming apparatus having density correction characteristic data and a section to execute density conversion on input image data includes a section to generate detecting patterns with multiple area ratios, a section to create images of the patterns on an image bearing member, a section to detect the images of the patterns created on the image bearing member, a section to hold detected values corresponding to the images of the patterns detected from the image bearing member, a section to obtain fixed values or previously detected values as target values for correction, and correction coefficients, a section to calculate a correction characteristic corresponding to the detecting patterns from the obtained target values, the detected values, and correction coefficients, and a section to synthesize new density correction characteristic data from the density correction characteristic data and the correction characteristic corresponding to the patterns.


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