The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Jan. 30, 2013
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Fumito Takemoto, Ashigarakami-gun, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01); B41F 33/00 (2006.01);
U.S. Cl.
CPC ...
G06K 15/027 (2013.01); B41F 33/0081 (2013.01); B41F 33/00 (2013.01); B41F 33/0036 (2013.01);
Abstract
Standard positional information is acquired about a plurality of regions of interest to be quantified, which are designated in a standard image region. An image magnification which represents a size ratio of measurement image region represented by the image data to the standard image region is calculated. Positional information of a plurality of regions of interest depending on the measurement image region is calculated based on the acquired standard positional information and the calculated image magnification.