The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Jul. 31, 2013
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Todd S. Sachs, Palto Alto, CA (US);

Kevin L. Hunter, Sunnyvale, CA (US);

Marco Zuliani, Los Gatos, CA (US);

Claus Molgaard, Los Gatos, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23216 (2013.01); H04N 17/002 (2013.01);
Abstract

A method for dynamically calibrating rotational offset in a device includes obtaining an image captured by a camera of the device. Orientation information of the device at the time of image capture may be associated with the image. Pixel data of the image may be analyzed to determine an image orientation angle for the image. A device orientation angle may be determined from the orientation information. A rotational offset, based on the image orientation angle and the device orientation angle, may be determined. The rotational offset is relative to the camera or orientation sensor. A rotational bias may be determined from statistical analysis of numerous rotational offsets from numerous respective images. In some embodiments, various thresholds and predetermined ranges may be used to exclude some rotational offsets from the statistical analysis or to discontinue processing for that image.


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