The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

May. 10, 2013
Applicant:

Stichting Imec Nederland, Eindhoven, NL;

Inventors:

Tobias Gemmeke, Leuven, BE;

Mario Konijnenburg, Leuven, BE;

Assignee:

Stichting IMEC Nederland, Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/10 (2006.01); G06F 3/02 (2006.01); G06F 1/32 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5031 (2013.01); G06F 1/324 (2013.01); G06F 17/505 (2013.01); G06F 1/3296 (2013.01); G06F 2217/84 (2013.01);
Abstract

An apparatus for monitoring timing of a plurality of critical paths of a functional circuit includes a plurality of canary circuits, each configured to be coupled to a critical path of a functional circuit for detecting and outputting critical timing events. Each canary circuit includes an adjustable delay element and an analyzer circuit for receiving a count of the critical timing event output from at least one of the plurality of canary circuits for a predetermined time interval for a plurality of delay values of the adjustable delay elements and for determining a probability distribution of critical timing events of the at least one of the plurality of critical paths for the predetermined time interval for the plurality of delay values.


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