The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Feb. 25, 2011
Applicants:
Zheng Ouyang, West Lafayette, IN (US);
Robert Graham Cooks, West Lafayette, IN (US);
Keyong Hou, Dalian, CN;
Inventors:
Zheng Ouyang, West Lafayette, IN (US);
Robert Graham Cooks, West Lafayette, IN (US);
Keyong Hou, Dalian, CN;
Assignee:
Purdue Research Foundation, West Lafayette, IN (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/26 (2006.01); H01J 49/24 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/26 (2013.01); H01J 49/0027 (2013.01); H01J 49/24 (2013.01); H01J 49/0495 (2013.01);
Abstract
The invention generally relates to improved sensitivity and flexibility for mass spectrometers with limited pumping capacity, particularly mass spectrometers that are coupled with a Discontinuous Atmospheric Pressure Interface (DAPI).