The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Jul. 08, 2009
Applicants:

Shigenori Tsuruga, Kanagawa, JP;

Kengo Yamaguchi, Nagasaki, JP;

Saneyuki Goya, Kanagawa, JP;

Satoshi Sakai, Kanagawa, JP;

Inventors:

Shigenori Tsuruga, Kanagawa, JP;

Kengo Yamaguchi, Nagasaki, JP;

Saneyuki Goya, Kanagawa, JP;

Satoshi Sakai, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/105 (2006.01); H01L 31/18 (2006.01); H01L 27/142 (2014.01); H01L 31/076 (2012.01); H01L 31/077 (2012.01);
U.S. Cl.
CPC ...
H01L 27/1423 (2013.01); H01L 31/1824 (2013.01); Y02E 10/547 (2013.01); Y02E 10/548 (2013.01); H01L 31/1804 (2013.01); H01L 31/076 (2013.01); H01L 31/077 (2013.01); Y02E 10/545 (2013.01);
Abstract

A photovoltaic device that exhibits increased open-circuit voltage and an improved fill factor due to an improvement in the contact properties between the n-layer and a back-side transparent electrode layer or intermediate contact layer, and a process for producing the photovoltaic device. The photovoltaic device comprises a photovoltaic layer having a p-layer, an i-layer and an n-layer stacked on top of a substrate, wherein the n-layer comprises a nitrogen-containing n-layer and an interface treatment layer formed on the opposite surface of the nitrogen-containing n-layer to the substrate, the nitrogen-containing n-layer comprises nitrogen atoms at an atomic concentration of not less than 1% and not more than 20%, and has a crystallization ratio of not less than 0 but less than 3, and the interface treatment layer has a crystallization ratio of not less than 1 and not more than 6.


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