The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Nov. 19, 2009
Applicants:

Keyan Zang, Singapore, SG;

Jinghua Teng, Singapore, SG;

Soo Jin Chua, Singapore, SG;

Inventors:

Keyan Zang, Singapore, SG;

Jinghua Teng, Singapore, SG;

Soo Jin Chua, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 33/00 (2010.01); H01L 33/20 (2010.01);
U.S. Cl.
CPC ...
H01L 21/0237 (2013.01); H01L 21/02639 (2013.01); H01L 33/20 (2013.01); H01L 33/0079 (2013.01); H01L 21/02521 (2013.01); H01L 21/02642 (2013.01); H01L 21/02664 (2013.01); H01L 21/0254 (2013.01); H01L 33/007 (2013.01); H01L 21/02647 (2013.01); H01L 21/02458 (2013.01); Y10S 977/742 (2013.01);
Abstract

A method of at least partially releasing an epitaxial layer of a material from a substrate. The method comprises the steps of: forming a patterned sacrificial layer on the substrate such that the substrate is partially exposed and partially covered by the sacrificial layer; growing the epitaxial layer on the patterned sacrificial layer by nano-epitaxial lateral overgrowth such that the epitaxial layer is formed above an intermediate layer comprising the patterned sacrificial layer and said material; and selectively etching the patterned sacrificial layer such that the epitaxial layer is at least partially released from the substrate.


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