The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Jul. 23, 2009
Applicants:

Christian Marty, Rotkreuz, CH;

Markus Rinderknecht, Adligenswil, CH;

Inventors:

Christian Marty, Rotkreuz, CH;

Markus Rinderknecht, Adligenswil, CH;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G06K 9/00 (2006.01); G01N 35/04 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/00594 (2013.01); G01N 35/0099 (2013.01); G01N 35/02 (2013.01); G01N 35/00732 (2013.01); G01N 35/028 (2013.01); G01N 2035/0425 (2013.01);
Abstract

A method and laboratory system for handling sample tubes and an image analyzing unit are disclosed. An incoming primary rack (PR) containing sample tubes (S) is transferred to an image analyzing unit (310). Geometry parameters of at least one sample tube contained in the primary rack are determined by means of image analyzing and compared with predetermined geometry criteria. If the sample tube's geometry fulfils the criteria, the sample tube is categorized as system conform and removed from the primary rack with a gripper for further processing; otherwise it is categorized as non-system conform and entered into error processing.


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