The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Jun. 11, 2007
Applicants:

Michiko Seyama, Atsugi, JP;

Serge Camou, Atsugi, JP;

Yuzuru Iwasaki, Atsugi, JP;

Toru Miura, Atsugi, JP;

Jyunichi Takahashi, Atsugi, JP;

Tsuneyuki Haga, Atsugi, JP;

Tsutomu Horiuchi, Atsugi, JP;

Inventors:

Michiko Seyama, Atsugi, JP;

Serge Camou, Atsugi, JP;

Yuzuru Iwasaki, Atsugi, JP;

Toru Miura, Atsugi, JP;

Jyunichi Takahashi, Atsugi, JP;

Tsuneyuki Haga, Atsugi, JP;

Tsutomu Horiuchi, Atsugi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/40 (2006.01); G01N 21/01 (2006.01); B01L 3/00 (2006.01); G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); B01L 2300/0864 (2013.01); B01L 2300/0645 (2013.01); B01L 2300/069 (2013.01); B01L 2300/0861 (2013.01); B01L 2200/148 (2013.01); B01L 2400/084 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0825 (2013.01); B01L 3/502715 (2013.01);
Abstract

The present invention relates to a chip for optical analysis. In particular, the present invention relates to an optical sensor handling a liquid sample, which is a chip for analysis that can be used for selectively measuring a biologically-relevant substance or a chemical substance such as an environmental pollutant or a health affecting substance in a liquid to be measured. The chip for optical analysis of the present invention is characterized in that (1) an adsorption region (filter region) is provided between a sample introduction section and the observation section in a passage of the chip for analysis, (2) a bypass passage is provided in the passage (main passage) of the chip for analysis, and a time lag is generated between samples passed through the main passage and passed through a bypass passage, and (3) a measurement region and a reference region are provided in the observation section of the chip for analysis. In the present invention, the aspects (1) to (3) can be achieved individually or two or more thereof can be combined.


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