The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

Dec. 14, 2011
Applicants:

Carlton Nigel Dodge, Ballasalla, IM;

Paul Nicolas Inglis, Ascot, GB;

Geoffrey Alan Scarsbrook, Ascot, GB;

Timothy Peter Mollart, Ascot, GB;

Charles Simon James Pickles, Ascot, GB;

Steven Edward Coe, Ascot, GB;

Joseph Michael Dodson, Ascot, GB;

Alexander Lamb Cullen, Ascot, GB;

John Robert Brandon, Ascot, GB;

Christopher John Howard Wort, Ascot, GB;

Inventors:
Assignee:

Element Six Limited, Ballasalla, IM;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); C23C 16/27 (2006.01); C23C 16/52 (2006.01); C23C 16/511 (2006.01);
U.S. Cl.
CPC ...
C23C 16/274 (2013.01); C23C 16/52 (2013.01); C23C 16/511 (2013.01);
Abstract

A microwave plasma reactor for manufacturing synthetic diamond material via chemical vapor deposition, the microwave plasma reactor comprising: a microwave generator configured to generate microwaves at a frequency f; a plasma chamber comprising a base, a top plate, and a side wall extending from said base to said top plate defining a resonance cavity for supporting a microwave resonance mode between the base and the top plate; a microwave coupling configuration for feeding microwaves from the microwave generator into the plasma chamber; a gas flow system for feeding process gases into the plasma chamber and removing them therefrom; a substrate holder disposed in the plasma chamber and comprising a supporting surface for supporting a substrate; and a substrate disposed on the supporting surface, the substrate having a growth surface on which the synthetic diamond material is to be deposited in use, wherein the substrate dimensions and location within the resonance cavity are selected to generate a localized axisymmetric Eelectric field profile across the growth surface in use, the localized axisymmetric Eelectric field profile comprising a substantially flat central portion bound by a ring of higher electric field, the substantially flat central portion extending over at least 60% of an area of the growth surface of the substrate and having an Eelectric field variation of no more than ±10% of a central Eelectric field strength, the ring of higher electric field being disposed around the central portion and having a peak Eelectric field strength in a range 10% to 50% higher than the central Eelectric field strength.


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