The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Feb. 27, 2013
Applicant:
The Research Foundation of State University of New York, Albany, NY (US);
Inventors:
Ki H. Chon, Mount Sinai, NY (US);
Kilwan Ju, Whitestone, NY (US);
Assignee:
The Research Foundation of State University of New York, Albany, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/02 (2006.01); G06F 17/14 (2006.01); A61B 5/0205 (2006.01); A61B 5/1455 (2006.01); A61B 5/08 (2006.01); A61B 5/00 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0205 (2013.01); G06F 17/14 (2013.01); A61B 5/726 (2013.01); G06K 9/00503 (2013.01); A61B 5/14551 (2013.01); A61B 5/7203 (2013.01); A61B 5/0806 (2013.01);
Abstract
A photoplethysmography apparatus and method is provided for high resolution estimating of Time-Frequency Spectra (TFS) and associated amplitudes using Variable Frequency Complex Demodulation (VFCDM), in a two-step procedure using a Time-Varying Optimal Parameter Search (TVOPS) technique to obtain TFS, followed by VFCDM to obtain even greater TFS resolution and instantaneous amplitudes associated with only specific frequencies of interest, via the combined TVOPS and VFCDM.