The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Jun. 14, 2012
Aurelian Dodoc, Heidenheim, DE;
Christian Bannert, Aalen, DE;
Vladan Blahnik, Oberkochen, DE;
Holger Sehr, Weimar, DE;
Aurelian Dodoc, Heidenheim, DE;
Christian Bannert, Aalen, DE;
Vladan Blahnik, Oberkochen, DE;
Holger Sehr, Weimar, DE;
Carl Zeiss AG, Oberkochen, DE;
Abstract
An anamorphic objective is provided for imaging an object onto an image acquisition unit. The anamorphic objective has at least one first plane of symmetry and at least one second plane of symmetry. The first plane of symmetry and the second plane of symmetry are oriented perpendicular to one another. The first plane of symmetry and the second plane of symmetry intersect and have a straight line of intersection (intersection line). A first objective section followed by a second objective section are arranged. A diaphragm is arranged between the first objective section and the second objective section. A first anamorphic optical element is arranged in the first objective section. A second anamorphic optical element is arranged in the second objective section. The anamorphic objective fulfills specified conditions and is suitable for generating a stigmatic imaging of the object on the image acquisition unit.