The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Sep. 23, 2011
Enrico C. Quintana, Albuquerque, NM (US);
Kyle R. Thompson, Albuquerque, NM (US);
David G. Moore, Albuquerque, NM (US);
Jack D. Heister, Albuquerque, NM (US);
Richard W. Poland, Aiken, SC (US);
John P. Ellegood, Aurora, CO (US);
George K. Hodges, Arab, AL (US);
James E. Prindville, Lincoln, CA (US);
Enrico C. Quintana, Albuquerque, NM (US);
Kyle R. Thompson, Albuquerque, NM (US);
David G. Moore, Albuquerque, NM (US);
Jack D. Heister, Albuquerque, NM (US);
Richard W. Poland, Aiken, SC (US);
John P. Ellegood, Aurora, CO (US);
George K. Hodges, Arab, AL (US);
James E. Prindville, Lincoln, CA (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.