The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2014
Filed:
Aug. 30, 2012
James Michael Enge, Spencerport, NY (US);
Joseph Edward Lill, Waynesville, OH (US);
Michael Patrick Fink, Springboro, OH (US);
Michael Joseph Piatt, Dayton, OH (US);
James Michael Enge, Spencerport, NY (US);
Joseph Edward Lill, Waynesville, OH (US);
Michael Patrick Fink, Springboro, OH (US);
Michael Joseph Piatt, Dayton, OH (US);
Brad Smith, Xenia, OH (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for aligning multi-channel digital image data for a digital printer having an array of printheads for each of a plurality of channels is described. A test pattern including test pattern indicia printed using individual printheads is scanned and analyzed to detect locations of the printed test pattern indicia. For each array position, one of the printheads is designated to be a reference printhead, and one or more of the other printheads are designated to be non-reference printheads. Spatial adjustment parameters are determined for each of the non-reference printheads responsive to the detected test pattern indicia locations. Digital image data to be printed with the non-reference printheads is modified in accordance with the determined spatial adjustment parameters.