The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2014

Filed:

May. 30, 2012
Applicants:

Martin Hacker, Jena, DE;

Martin Kuehner, Bad Klosterlausnitz, DE;

Rico Fuchs, Jena, DE;

Matthias Reich, Jena, DE;

Inventors:

Martin Hacker, Jena, DE;

Martin Kuehner, Bad Klosterlausnitz, DE;

Rico Fuchs, Jena, DE;

Matthias Reich, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Selection of an appropriate intraocular lens (IOL) and/or the applicable surgical parameters for optimizing the results of refractive procedures on the eye. Features of the IOL are crucial for the selection and/or adjustment of the optimal IOL, but so is the IOL selection method (and parameters) from a surgical perspective. For the method, corresponding output parameters are determined from predetermined, estimated, or measured input parameters and/or their mean values, wherein at least two input parameters are varied with one another and which have at least one input parameter as a distribution function. The resulting function is optimized by means of corresponding target values and the determined distribution function of one or more output parameters is used as a decision aid. The present solution is used for selecting an appropriate IOL and/or the applicable surgical parameters and is applicable in the field of eye surgery for implanting IOLs.


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