The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Aug. 25, 2010
Applicants:
Srivaths Ravi, Bangalore, IN;
Rajesh Kumar Tiwari, Bangalore, IN;
Rubin Ajit Parekhji, Bangalore, IN;
Inventors:
Srivaths Ravi, Bangalore, IN;
Rajesh Kumar Tiwari, Bangalore, IN;
Rubin Ajit Parekhji, Bangalore, IN;
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3185 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/318547 (2013.01);
Abstract
This invention permits selectively bypasses serial scan chains. Constant or low toggle data is directed to the bypassed serial scan chain, thus reducing power consumption. The number and identity of serial scan chains bypassed during a particular test can be changed dynamically dependent upon the semiconductor process variations of a particular integrated circuit. This enables an optimal test to be preformed for integrated circuits having differing semiconductor process variations.