The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jun. 01, 2011
Applicants:

Nicolas Hernan Bonadeo, Buenos Aires, AR;

Sebastian Berra, Buenos Aires, AR;

Javier Ignacio Etcheverry, Buenos Aires, AR;

Inventors:

Nicolas Hernan Bonadeo, Buenos Aires, AR;

Sebastian Berra, Buenos Aires, AR;

Javier Ignacio Etcheverry, Buenos Aires, AR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06T 17/30 (2006.01); G06K 9/00 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2425 (2013.01);
Abstract

Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X', Y′, Z′) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.


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