The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Aug. 31, 2012
Applicants:

David B. Spencer, Bedford, MA (US);

Jeffrey J. Webster, Leeds, MA (US);

Aldo M. Reti, Cape Coral, FL (US);

Edward J. Sommer, Jr., Nashville, TN (US);

Richard E. Hill, Nashville, TN (US);

R. Lynn Conley, Antioch, TN (US);

Inventors:

David B. Spencer, Bedford, MA (US);

Jeffrey J. Webster, Leeds, MA (US);

Aldo M. Reti, Cape Coral, FL (US);

Edward J. Sommer, Jr., Nashville, TN (US);

Richard E. Hill, Nashville, TN (US);

R. Lynn Conley, Antioch, TN (US);

Assignee:

Spectramet, LLC, Bedford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G01N 23/06 (2006.01); B07C 5/346 (2006.01); G01N 23/02 (2006.01); G01N 23/223 (2006.01); B07C 5/34 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3416 (2013.01); G01N 23/06 (2013.01); B07C 5/346 (2013.01); G01N 23/02 (2013.01); G01N 23/223 (2013.01); G01N 2223/64 (2013.01); G01N 2223/643 (2013.01);
Abstract

Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.


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