The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jun. 15, 2012
Applicants:

Takayuki Nagata, Osaka, JP;

Shinichi Kadowaki, Fukuoka, JP;

Inventors:

Takayuki Nagata, Osaka, JP;

Shinichi Kadowaki, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61B 5/00 (2006.01); A61B 8/00 (2006.01); A61B 8/08 (2006.01); A61B 8/14 (2006.01);
U.S. Cl.
CPC ...
A61B 8/14 (2013.01); A61B 5/0091 (2013.01); A61B 8/4218 (2013.01); A61B 8/0825 (2013.01); A61B 8/4245 (2013.01); A61B 5/0064 (2013.01); A61B 8/0841 (2013.01); A61B 5/0059 (2013.01); A61B 8/5292 (2013.01);
Abstract

The ultrasound examination apparatus according to an exemplary embodiment of the present disclosure is an ultrasound examination apparatus for observing an inside of a body of a living subject and includes: a transmitting probe that transmits ultrasonic waves to an inside of an examination target which is a part of the living subject; a receiving probe that detects microscopic displacement on a surface of the examination target without contact with the examination target, to detect reflected ultrasonic waves which are the to ultrasonic waves reflected from the inside of the examination target; and a signal processing unit that generates an image of the inside of the examination target, based on the reflected ultrasonic waves during a scanning operation in which the transmitting probe is kept fixed with respect to the examination target and the receiving probe is moved with respect to the examination target.


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