The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Nov. 14, 2012
Applicant:

Cardinal CG Company, Spring Green, WI (US);

Inventors:

Jordan B. Lagerman, Spring Green, WI (US);

Keith J. Burrows, Mineral Point, WI (US);

Kyle R. Thering, Avoca, WI (US);

Assignee:

Cardinal CG Company, Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/26 (2006.01); G02B 6/42 (2006.01); G01N 21/86 (2006.01); G01V 8/00 (2006.01); G01N 21/88 (2006.01); G01N 21/27 (2006.01); G01N 21/84 (2006.01); G01J 3/42 (2006.01); G01N 21/896 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01N 21/274 (2013.01); G01N 21/8422 (2013.01); G01N 2021/8609 (2013.01); G01N 21/896 (2013.01); G01N 2021/8427 (2013.01);
Abstract

A system for measuring properties of a thin film coated glass having a light source, a spectrometer, at least one pair of probes, a first optical fiber switch and a second optical fiber switch. The pair of probes includes a first probe located on one side of a glass sheet and a second probe located on the opposite side of the glass sheet, directly across from the first probe. The first and second optical fiber switches are adapted to couple either probe to the light source and/or the spectrometer. Because the design of the system is optically symmetrical, calibration may be performed without the use of a reference material such as a tile or mirror. Each of the first and second probes has a first leg and a second leg that are separated from each other by a distance n so that angled reflections may be detected.


Find Patent Forward Citations

Lagerman, Jordan. (2014). System and method for measuring properties of a thin film coated glass (U.S. Patent No. 8855450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8855450

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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