The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Apr. 29, 2011
Jeffrey C. Wehnes, Richardson, TX (US);
James P. Monaco, Piscataway, NJ (US);
David S. Harding, Austin, TX (US);
James H. Pike, Carrollton, TX (US);
Anbinh T. Ho, Dallas, TX (US);
Lawrence M. Hanafy, New Orleans, LA (US);
Jeffrey C. Wehnes, Richardson, TX (US);
James P. Monaco, Piscataway, NJ (US);
David S. Harding, Austin, TX (US);
James H. Pike, Carrollton, TX (US);
Anbinh T. Ho, Dallas, TX (US);
Lawrence M. Hanafy, New Orleans, LA (US);
vuCOMP, Inc., Plano, TX (US);
Abstract
An analysis of a digitized image is provided. The digitized image is repeatedly convolved to form first convolved images, which first convolved images are convolved a second time to form second convolved images. Each first convolved image and the respective second convolved image representing a stage, and each stage represents a different scale or size of anomaly. As an example, the first convolution may utilize a Gaussian convolver, and the second convolution may utilize a Laplacian convolver, but other convolvers may be used. The second convolved image from a current stage and the first convolved image from a previous stage are used with a neighborhood median determined from the second convolved image from the current stage by a peak detector to detect peaks, or possible anomalies for that particular scale.