The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Dec. 15, 2010
Applicants:

Toshio Kamei, Tokyo, JP;

Yoichi Nakamura, Tokyo, JP;

Inventors:

Toshio Kamei, Tokyo, JP;

Yoichi Nakamura, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The similarity calculation device is provided with a displacement vector estimation unitfor estimating a displacement vector between a first local region set in a first image, and a second local region which is most similar to the first local region in a second image, a geometric transformation parameter estimation unitfor estimating a geometric transformation parameter which geometrically transforms the first image into the second image, a displacement vector correction unitfor correcting the displacement vector based on the geometric transformation parameter, a scoring unitfor scoring the displacement vector, corrected by the displacement vector correction unit, in a two-dimensional space and creating a scored image, a peak detection unitfor detecting a peak in the scored image, and a similarity calculation unitfor calculating a similarity of the first image and the second image according to a size of the peak.


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