The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
May. 22, 2012
Yasushi Tanase, Nerima-ku, JP;
Takeshi Miura, Bunkyo-ku, JP;
Yasuhiro Todoroki, Musashino, JP;
Toshiki Shiino, Bunkyo-ku, JP;
Kensuke Habuka, Bunkyo-ku, JP;
Yasushi Tanase, Nerima-ku, JP;
Takeshi Miura, Bunkyo-ku, JP;
Yasuhiro Todoroki, Musashino, JP;
Toshiki Shiino, Bunkyo-ku, JP;
Kensuke Habuka, Bunkyo-ku, JP;
Morpho, Inc., Tokyo, JP;
Abstract
The invention provides an image identification device that classifies block images obtained by dividing a target image into predetermined categories, using a separating plane learning of which has been completed in advance for each of the categories. The image identification device includes a target image input unit inputs the target image, a block image generation unit divides the target image into blocks to generate the block images, a feature quantity computing unit computes feature quantities of the block images, and a category determination unit determines whether the block images are classified into one of the categories or not, using the separating plane and coordinate positions corresponding to magnitudes of feature quantities of the block images in a feature quantity space, wherein the feature quantity computing unit uses, as a feature quantity of a given target block image, local feature quantities and a global feature quantity.