The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Feb. 08, 2005
Applicants:

Jeffrey M. Dicarlo, Menlo Park, CA (US);

Steven W. Trovinger, Los Altos, CA (US);

Glen Eric Montgomery, San Jose, CA (US);

Inventors:

Jeffrey M. DiCarlo, Menlo Park, CA (US);

Steven W. Trovinger, Los Altos, CA (US);

Glen Eric Montgomery, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/409 (2006.01); H04N 1/401 (2006.01); H04N 17/00 (2006.01); H04N 1/48 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); H04N 1/401 (2013.01); H04N 1/484 (2013.01);
Abstract

Imaging device analysis systems and imaging device analysis methods are described. According to one embodiment, an imaging device analysis system includes a light source configured to generate a plurality of light beams for analysis of an imaging device, wherein the light beams comprise light of a plurality of different spectral power distributions, processing circuitry coupled with the light source and configured to control the light source to generate the light beams, and an optical interface optically coupled with a light receiving member of the imaging device and configured to communicate the plurality of light beams to the light receiving member of the imaging device.


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