The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Oct. 16, 2013
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Norman Henry Fontaine, Painted Post, NY (US);

Vitor Marino Schneider, Painted Post, NY (US);

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01N 21/41 (2006.01); G01N 21/23 (2006.01); G01L 1/24 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 21/412 (2013.01); G01N 21/41 (2013.01); G01N 21/23 (2013.01); G01L 1/24 (2013.01); G01M 11/30 (2013.01);
Abstract

Systems and methods for measuring a profile of a glass sample () are disclosed. The method includes scanning a polarization-switched light beam (PS) through the glass sample and a reference block () for different depths into the glass sample to define a transmitted polarization-switched light beam. The method also includes measuring an amount of power in the polarization-switched light beam to form a polarization-switched reference signal (SR), and detecting the transmitted polarization-switched light beam to form a polarization-switched detector signal (SD). The method further includes dividing the polarization-switched detector signal by the polarization-switched reference signal to define a normalized polarization-switched detector signal (SN). Processing the normalized polarization-switched detector signal determines the profile characteristic.


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