The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Mar. 31, 2011
Applicants:

Joseph F. Ahadian, San Marcos, CA (US);

Charles B. Kuznia, Encinitas, CA (US);

Richard T. Hagan, Mission Viejo, CA (US);

Ricard J. Pommer, Carlsbad, CA (US);

Inventors:

Joseph F. Ahadian, San Marcos, CA (US);

Charles B. Kuznia, Encinitas, CA (US);

Richard T. Hagan, Mission Viejo, CA (US);

Ricard J. Pommer, Carlsbad, CA (US);

Assignee:

Ultra Communications, Inc., Vista, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01); G01N 21/55 (2014.01); H04B 10/071 (2013.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01N 21/958 (2013.01); G01M 11/3154 (2013.01); G01N 21/55 (2013.01); H04B 10/071 (2013.01); G01M 11/3145 (2013.01);
Abstract

An optical time domain reflectometry system is described which provides low-power, low weight, optical fiber system integrity measurements in an in-situ optical fiber system. The system can be integrated within the transmitter component to allow both data transmission and OTDR measurement functions. A method of providing several different modes of OTDR measurement through external control is also disclosed.


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