The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jan. 06, 2010
Applicants:

Kosta Kovacic, Maribor, SI;

Anton Pletersek, Orehova Vas, SI;

Andrej Vodopivec, Ljubljana, SI;

William Peyton Roberts, Spartanburg, SC (US);

Oluf Alminde, Lachon, CH;

Inventors:

Kosta Kovacic, Maribor, SI;

Anton Pletersek, Orehova Vas, SI;

Andrej Vodopivec, Ljubljana, SI;

William Peyton Roberts, Spartanburg, SC (US);

Oluf Alminde, Lachon, CH;

Assignee:

AMS R&D D.O.O., Ljubljana, SI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 5/22 (2006.01); G08B 1/08 (2006.01); G06K 19/07 (2006.01);
U.S. Cl.
CPC ...
G06K 19/0723 (2013.01); G06K 19/0717 (2013.01);
Abstract

Prior to logging of a process flags for locking at all addresses of a logging area of a tag are set to state 1 by means of an interrogator. A high limit (h) and a low limit (l) of an interval (l-h) of such values (v) of a physical parameter are determined, which are proper for preserving usability of a tagged article. Said values (v) acquired with a sensor and acquisition times related thereto are converted into less numerous data characterizing the process by observing said limits (h, l). Said data characterizing the process are logged in said logging area. Said process log cannot be modified in any way at a later stage. The invention also provides for an efficient observation of longer period of the process in the tagged article in order to inspect the usability thereof.


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