The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jul. 15, 2011
Applicants:

Sualp Aras, Dallas, TX (US);

Tatsuyuki Nihei, Tokyo, JP;

Abidur Rahman, Allen, TX (US);

Inventors:

Sualp Aras, Dallas, TX (US);

Tatsuyuki Nihei, Tokyo, JP;

Abidur Rahman, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G01R 27/28 (2006.01); G06F 3/041 (2006.01); G01F 7/00 (2006.01); H03M 11/02 (2006.01); H03M 3/00 (2006.01); G01D 5/24 (2006.01); G06F 3/044 (2006.01); G01P 15/125 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G01P 15/125 (2013.01); H03M 11/02 (2013.01); H03M 3/34 (2013.01); G01D 5/24 (2013.01); H03M 3/458 (2013.01);
Abstract

A method for measuring for generating a touch capacitance measurement is provided. Gain and offset control signals are generated, where the gain and offset control signals are adjusted to compensate for base capacitance of a touch sensor. The gain control signal is applied to a touch sensor during a first phase of a clock signal, and the offset control signal is applied to an output circuit during a second phase of the clock signal. The output circuit is coupled to the touch sensor during the second phase of the clock signal. The touch capacitance measurement is generated by compensating for the base capacitance with the gain and offset control signals, and a gain is applied to the touch capacitance measurement.


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