The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Jul. 21, 2011
Stephan Kannengiesser, Wuppertal, DE;
Jan Ruff, Munich, DE;
Stephan Kannengiesser, Wuppertal, DE;
Jan Ruff, Munich, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and system for magnetic resonance imaging of an examination subject on the basis of partially parallel acquisition (PPA) with multiple component coils, a calibration measurement is implemented in a first time period and an actual measurement for the imaging is implemented in a subsequent second time period. In the calibration measurement, calibration data for predetermined calibration points in spatial frequency space are acquired with the multiple component coils. In the actual measurement, incomplete data sets are respectively acquired in spatial frequency space with each of the multiple component coils. Complete data sets are reconstructed from the incomplete data sets and the calibration data. The first time period and the second time period are different, and the measurements are implemented when triggered in the two time periods. An essentially identical state of the examination subject or of the measurement system is used as a trigger.