The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Feb. 10, 2011
Applicant:

Yoshitomo Fujisawa, Kawasaki, JP;

Inventor:

Yoshitomo Fujisawa, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 21/48 (2006.01); H01L 25/10 (2006.01); H01L 23/13 (2006.01); H01L 23/498 (2006.01); H01L 23/00 (2006.01); H05K 1/14 (2006.01); H01L 23/31 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
H01L 25/105 (2013.01); H01L 2924/15331 (2013.01); H01L 23/13 (2013.01); H01L 2225/1058 (2013.01); H01L 2224/16225 (2013.01); H01L 23/49822 (2013.01); H01L 21/481 (2013.01); H01L 24/48 (2013.01); H01L 23/562 (2013.01); H05K 1/144 (2013.01); H01L 2924/3511 (2013.01); H01L 23/49816 (2013.01); H01L 2224/73265 (2013.01); H01L 2924/15311 (2013.01); H01L 23/3121 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/48227 (2013.01); H01L 25/0657 (2013.01);
Abstract

In a semiconductor device according to the present invention, a solder resist has a plurality of openings that expose electrodes. Solder bumps are formed in the openings and each have a solder ball portion protruding from the corresponding opening. The height of the openings is set to increase with increasing gap distance between the electrodes of an interposer substrate and board electrodes of a printed wiring board on which the semiconductor device is mounted. Thus, the solder bumps that correspond to sections where the gap distance is large can be increased in height, whereas the solder bumps that correspond to sections where the gap distance is small can be decreased in height, thereby avoiding the occurrence of defective joints caused by a reduction in size and thickness of the interposer substrate, as well as extending the lifespan of solder joints.


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