The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Dec. 06, 2012
Applicant:

Faquir C. Jain, Storrs, CT (US);

Inventors:

Faquir C. Jain, Storrs, CT (US);

Robert A. Croce, Jr., Guilford, CT (US);

Anjana Jain, Worcester, CT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 31/00 (2006.01); H01L 29/66 (2006.01); B82Y 99/00 (2011.01);
U.S. Cl.
CPC ...
H01L 29/66 (2013.01); B82Y 99/00 (2013.01); H01L 29/0684 (2013.01); Y10S 977/773 (2013.01);
Abstract

Quantum dot (QD) gate FETs and the use of quantum dot (QD) gate FETs for the purpose of sensing analytes and proteins is disclosed and described. Analytes, proteins, miRNAs, and DNAs functionalized to the QDs change the charge density in the gate and hence the current-voltage characteristics. In one embodiment, QD-FETs, such as 3-state configurations, the binding of chemical and biological species change the drain current-gate voltage characteristics resulting in detection. In one embodiment, DNA sensing is done by its binding to an existing reference DNA functionalized on to quantum dots which are located in the gate region of the FET.


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