The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2014
Filed:
Feb. 04, 2014
Applicant:
University of Yamanashi, Kofu, JP;
Inventors:
Kenzo Hiraoka, Kofu, JP;
Lee Chuin Chen, Kofu, JP;
Assignee:
University of Yamanashi, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/10 (2006.01); H01J 49/00 (2006.01); H01J 27/00 (2006.01); G01N 27/68 (2006.01); H01J 49/14 (2006.01); H05H 1/24 (2006.01);
U.S. Cl.
CPC ...
H01J 49/10 (2013.01); H05H 2001/2412 (2013.01); H05H 1/2406 (2013.01); H05H 2001/2443 (2013.01); G01N 27/68 (2013.01); H01J 49/145 (2013.01); H01J 49/105 (2013.01);
Abstract
A sampling nozzle, an ion supply tubeleading to an analysis apparatusand a barrier discharge tubeare connected to first, second and third ends, respectively, of a T-shaped tubehaving three connecting ports, and the central portion of the T-shaped tube is an ionization chamber SP. The ionization chamber SP is a closed space, and ions generated therein are introduced to the analysis apparatusthrough the ion supply tube. As a result, almost all of the ions are introduced into the interior of the analysis apparatus.