The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2014

Filed:

Jun. 18, 2012
Applicants:

Masahiro Seki, Nara, JP;

Yoshitaka Sekiguchi, Hyogo, JP;

Ryota Inoue, Osaka, JP;

Kazuoki Fuwa, Hyogo, JP;

Inventors:

Masahiro Seki, Nara, JP;

Yoshitaka Sekiguchi, Hyogo, JP;

Ryota Inoue, Osaka, JP;

Kazuoki Fuwa, Hyogo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 9/08 (2006.01); G03G 9/087 (2006.01); G03G 9/097 (2006.01); G03G 5/147 (2006.01);
U.S. Cl.
CPC ...
G03G 5/14795 (2013.01); G03G 9/08797 (2013.01); G03G 9/09783 (2013.01); G03G 9/09733 (2013.01); G03G 5/14786 (2013.01); G03G 9/09791 (2013.01); G03G 9/097 (2013.01); G03G 9/08795 (2013.01);
Abstract

A toner including: a base resin; and charge-controlling resin particles contained in the base resin, wherein the toner is in shape of particles, and the charge-controlling resin particles are present in a region of each toner particle which is 500 nm in depth from a surface of the toner particle and an average of amounts of the charge-controlling resin particles present in the regions of the toner particles is 20% by volume to 70% by volume, wherein an average of embedment rates of the charge-controlling resin particles in the toner particles is 90% or higher, where each embedment rate is an average of embedment rates of the charge-controlling resin particles in each toner particle, and wherein the charge-controlling resin particles have a charge amount of 60 μC/mor more as measured by a blow-off method.


Find Patent Forward Citations

Loading…