The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8852531 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 07, 2014

Filed:

Nov. 24, 2008
Applicants:

Jan Gerritse, Apeldoorn, NL;

Johannes Wouterus Van Groenestijn, Apeldoorn, NL;

Neeltje Dina Zegers, Delft, NL;

Inventors:

Jan Gerritse, Apeldoorn, NL;

Johannes Wouterus van Groenestijn, Apeldoorn, NL;

Neeltje Dina Zegers, Delft, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 35/00 (2006.01); C12Q 1/54 (2006.01); C12Q 1/04 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/04 (2013.01); C12Q 1/54 (2013.01); G01N 2333/245 (2013.01); G01N 2333/924 (2013.01);
Abstract

The present invention relates to a system for detecting microbial contamination of a liquid specimen comprising a device for concentrating micro-organisms from a liquid specimen, having (i) a hypobaric chamber, (ii) a filter housing comprising a liquid-permeable bed of an adsorbent material and adapted for being fluidly connected to said hypobaric chamber, and (iii) a vacuum pump adapted for being fluidly connected to said hypobaric chamber, said system further comprising a kit for detection of micro-organisms adsorbed to said adsorbent material, wherein said kit is based on enzymatic detection using chromogenic and/or fluorescent substrate analogs.


Find Patent Forward Citations

Gerritse, Jan. (2014). System for detecting microbial contamination (U.S. Patent No. 8852531). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8852531

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…